Characterization of power induced heating and damage in fiber optic probes for near-field scanning optical microscopy

Review of Scientific Instruments

Volumn 78, Issue 5, 2007, Pages

  Dickenson, Nicholas E ^a   Erickson, Elizabeth S ^a   Mooren, Olivia L ^a   Dunn, Robert C ^a  

^a UNIVERSITY OF KANSAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; FIBER OPTICS; OPTICAL FIBER FABRICATION; SPECTRUM ANALYSIS; THERMAL EFFECTS; THERMAL STRESS;

HALF-CONE ANGLE; NEAR-FIELD SCANNING OPTICAL MICROSCOPY; PROBES FABRICATION; THERMOCHROMIC POLYMERS;

OPTICAL MICROSCOPY;

ARTICLE; ENERGY TRANSFER; EQUIPMENT; EVALUATION; FIBER OPTICS; HEAT; INSTRUMENTATION; SCANNING PROBE MICROSCOPY; TRANSDUCER;

ENERGY TRANSFER; EQUIPMENT FAILURE; EQUIPMENT FAILURE ANALYSIS; FIBER OPTICS; HEAT; MICROSCOPY, SCANNING PROBE; TRANSDUCERS;

EID: 34249948460     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2740133     Document Type: Article

References (26)

1. R. C. Dunn, Chem. Rev. (Washington, D.C.) 99, 2891 (1999).
2. M. Edidin, Traffic (Oxford, U. K.) 2, 797 (2001).
3. L. Novotny and B. Hecht, Principles of Nano-Optics (Cambridge University Press, New York, 2006).
4. B. N. Flanders and R. C. Dunn, Ultramicroscopy 91, 245 (2002).
5. P. F. Barbara, D. M. Adams, and D. B. O'Connor, Annu. Rev. Mater. Sci. 29, 433 (1999).
6. B. Hecht, B. Sick, U. P. Wild, V. Deckert, R. Zenobi, O. J. F. Martin, and D. W. Pohl, J. Chem. Phys. 112, 7761 (2000).
7. B. I. Yakobson, A. LaRosa, H. D. Hallen, and M. A. Paesler, Ultramicroscopy 61, 179 (1995).
8. M. Stahelin, M. A. Bopp, G. Tarrach, A. J. Meixner, and I. Zschokke-Granacher, Appl. Phys. Lett. 68, 2603 (1996).
9. A. Lazarev, N. Fang, Q. Luo, and X. Zhang, Rev. Sci. Instrum. 74, 3679 (2003).
10. E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, and R. L. Kostelak, Science 251, 1468 (1991).
11. P. Burgos, Z. Lu, A. Ianoul, C. Hnatovsky, M. L. Viriot, L. J. Johnston, and R. S. Taylor, J. Microsc. 211, 37 (2003).
12. P. Hoffmann, B. Dutoit, and R.-P. Salathe, Ultramicroscopy 61, 165 (1995).
13. D. W. Pohl, IBM J. Res. Dev. 39, 701 (1995).
14. P. G. Gucciardi, M. Colocci, M. Labardi, and M. Allegrini, Appl. Phys. Lett. 75, 3408 (1999).
15. C. Lienau, A. Richter, and T. Elsaesser, Appl. Phys. Lett. 69, 325 (1996).
16. A. H. L. Rosa, B. I. Yakobson, and H. D. Hallen, Appl. Phys. Lett. 67, 2597 (1995).
17. L. Thiery, N. Marini, J.-P. Prenel, M. Spajer, C. Bainier, and D. Courjon, Int. J. Therm. Sci. 39, 519 (2000).
18. E. S. Erickson and R. C. Dunn, Appl. Phys. Lett. 87, 201102 (2005).
19. V. Kurpas, M. Libenson, and G. Martsinovsky, Ultramicroscopy 61, 187 (1995).
20. L. Thiery and N. Marini, Ultramicroscopy 94, 49 (2003).
21. D. R. Turner, U.S. Patent No. 4,469,554 (1984).
22. C. W. Hollars and R. C. Dunn, Rev. Sci. Instrum. 69, 1747 (1998).
23. N. Chandrasekharan and L. A. Kelly, J. Am. Chem. Soc. 123, 9898 (2001).
24. C. W. Hollars and R. C. Dunn, J. Chem. Phys. 112, 7822 (2000).
25. L. Novotny and C. Hafner, Phys. Rev. E 50, 4094 (1994).
26. P. Moar, F. Ladouceur, and L. Cahill, Appl. Opt. 39, 1966 (2000).