Multi-frequency near-field scanning optical microscopy

Nanotechnology

Volumn 25, Issue 3, 2014, Pages

  Kohlgraf Owens, Dana C ^a   Greusard, Léo ^b   Sukhov, Sergey ^a   Wilde, Yannick De ^b   Dogariu, Aristide ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

^b INSTITUT LANGEVIN   (France)

Author keywords

atomic force microscopy; near field scanning optical microscopy; optical force; opto mechanics; scanning probe microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROMAGNETIC WAVES; SCANNING PROBE MICROSCOPY;

BROADBAND DETECTION; DIFFERENT FREQUENCY; FEEDBACK REGULATION; OPTICAL FORCE; OPTICALLY INDUCED FORCES; OPTO-MECHANICS; RADIATION DISTRIBUTION; SPATIAL RESOLUTION;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 84896527299     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/25/3/035203     Document Type: Article

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