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Volumn 37, Issue 2 PART A, 1998, Pages

Force imaging of optical near-field using noncontact mode atomic force microscopy

Author keywords

Evanescent field; Force imaging; Frequency modulation detection method; Near field optics; Noncontact mode atomic force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; FREQUENCY MODULATION; LATEXES; POLYSTYRENES;

FREQUENCY MODULATION DETECTION METHOD; NEAR FIELD OPTICS; NONCONTACT MODE ATOMIC FORCE MICROSCOPY (NCAFM); OPTICAL EVANESCENT FIELDS;

VAN DER WAALS FORCES;

EID: 0031997192 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.37.l167 Document Type: Article

Times cited : (6)

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