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Volumn 107, Issue 10, 2010, Pages

Kelvin probe force microscope with near-field photoexcitation

Author keywords

[No Author keywords available]

Indexed keywords

FIBER PROBE; KELVIN PROBE FORCE MICROSCOPES; NEAR FIELD OPTICAL MICROSCOPE; NEAR-FIELD; NEGATIVE VALUES; OPTICAL FIBER PROBE; PHOTO-INDUCED; PROBE MICROSCOPE; SCANNING PROBES; SPATIAL PATTERNS; SUBMICRON SPATIAL RESOLUTION;

EID: 77953005981     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3373430     Document Type: Article
Times cited : (7)

References (17)
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  • 12
    • 3042511595 scopus 로고    scopus 로고
    • Tip-to-sample distance dependence of an electrostatic force in KFM measurements
    • DOI 10.1016/j.ultramic.2004.01.017, PII S0304399104000415
    • T. Takahashi and S. Ono, Ultramicroscopy ULTRD6 0304-3991 100, 287 (2004). 10.1016/j.ultramic.2004.01.017 (Pubitemid 38834137)
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    • Takahashi, T.1    Ono, S.2
  • 16
    • 7544221267 scopus 로고    scopus 로고
    • APPLAB 0003-6951. 10.1063/1.1797539
    • G. M. Sacha and J. J. Saenz, Appl. Phys. Lett. APPLAB 0003-6951 85, 2610 (2004). 10.1063/1.1797539
    • (2004) Appl. Phys. Lett. , vol.85 , pp. 2610
    • Sacha, G.M.1    Saenz, J.J.2
  • 17
    • 0001562093 scopus 로고
    • JAPIAU 0021-8979. 10.1063/1.358758
    • O. Vatel and M. Tanimoto, J. Appl. Phys. JAPIAU 0021-8979 77, 2358 (1995). 10.1063/1.358758
    • (1995) J. Appl. Phys. , vol.77 , pp. 2358
    • Vatel, O.1    Tanimoto, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.