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Optics Letters

Volumn 36, Issue 24, 2011, Pages 4758-4760

Optical-force-induced artifacts in scanning probe microscopy

(3) Kohlgraf Owens, Dana C a Sukhov, Sergey a Dogariu, Aristide a

a UNIVERSITY OF CENTRAL FLORIDA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NEAR-FIELD SCANNING; OPTICAL FIELD; OPTICAL SIGNALS; OPTICALLY INDUCED FORCES; TOPOGRAPHIC MAP;

MAPS; OPTICAL RECORDING; SCANNING PROBE MICROSCOPY;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ARTICLE; ARTIFACT; ATOMIC FORCE MICROSCOPY; ELECTROMAGNETIC RADIATION; EQUIPMENT DESIGN; MECHANICAL STRESS; METHODOLOGY; MICROSCOPY; OPTICS; REPRODUCIBILITY; SCANNING PROBE MICROSCOPY; SIGNAL PROCESSING;

ARTIFACTS; ELECTROMAGNETIC RADIATION; EQUIPMENT DESIGN; MICROSCOPY; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, SCANNING PROBE; OPTICS AND PHOTONICS; REPRODUCIBILITY OF RESULTS; SIGNAL PROCESSING, COMPUTER-ASSISTED; STRESS, MECHANICAL;

EID: 84055200454 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.36.004758 Document Type: Article

Times cited : (14)

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