Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments

Review of Scientific Instruments

Volumn 83, Issue 5, 2012, Pages

  Labuda, Aleksander ^a   Kobayashi, Kei ^b   Miyahara, Yoichi ^a   Grütter, Peter ^a  

^a MCGILL UNIVERSITY   (Canada)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPE (AFM); DYNAMIC ATOMIC FORCE MICROSCOPY; FORCE SPECTROSCOPY; PHOTOTHERMAL EXCITATION; Q-VALUES;

IONIC LIQUIDS; NANOCANTILEVERS;

ATOMIC FORCE MICROSCOPY;

EID: 84862127950     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4712286     Document Type: Review

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