Near-field optical imaging using force detection with new tip-electrode geometry

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 383-387

  Abe, M ^a   Sugawara, Y ^a   Sawada, K ^a   Andoh, Y ^a   Morita, S ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

61.16.Ch; 68.35.Bs; 78.20.Wc; APN; Evanescent field; KE; Kelvin probe technique; Near field optics; Noncontact atomic force microscopy; SB15; WE

Indexed keywords

EID: 0040113403     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00559-5     Document Type: Article

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