Far-field optical nanoscopy

Science

Volumn 316, Issue 5828, 2007, Pages 1153-1158

  Hell, Stefan W ^a,b  

^a MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

^b GERMAN CANCER RESEARCH CENTER DKFZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; ELECTRON; LIGHT; MICROSCOPY; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; WAVELENGTH;

DIFFRACTION; FLUORESCENCE MICROSCOPY; NANOTECHNOLOGY; PRIORITY JOURNAL; REVIEW; SCANNING PROBE MICROSCOPY; SCIENCE;

ANIMALS; HUMANS; LIGHT; MICROSCOPY, FLUORESCENCE; NANOTECHNOLOGY;

EID: 34249945258     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1137395     Document Type: Review

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65. I thank M. Lang and J. Engelhardt (DKFZ) for providing Fig. 4A and L. Meyer and G. Donnert for providing Fig. 4C. E. Rittweger and V. Westphal (Max Planck Institute) helped prepare the figures. I also thank G. Donnert, C. Eggeling, A. Egner, S. Jakobs, L. Kastrup, B. Rankin, V. Westphal K. Willig, and A. Schönle for reading of the manuscript. Funding was from the Max Planck Society, Deutsche Forschungsgemeinschaft, Volkswagen Foundation, Landesstiftung Baden-Württemberg, European Union (New and Emerging Science and Technology, SPOTLITE), and German Ministry of Research and Education. The author consults for Leica Microsystems CMS Gmbh, Mannheim, Germany.