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Volumn 22, Issue 5, 2014, Pages 1150-1163

FinCANON: A PVT-aware integrated delay and power modeling framework for FinFET-based caches and on-chip networks

Author keywords

CACTI PVT; FinCANON; FinFETs; ORION PVT; PVT variations.

Indexed keywords

COMPUTER SIMULATION; DESIGN; EMBEDDED SYSTEMS; MOSFET DEVICES;

EID: 84899961856     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2013.2260569     Document Type: Article
Times cited : (25)

References (41)
  • 2
    • 70349755390 scopus 로고    scopus 로고
    • Mitigating the impact of variability on chip-multiprocessor power and performance
    • Oct.
    • S. Herbert and D. Marculescu, "Mitigating the impact of variability on chip-multiprocessor power and performance," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 17, no. 10, pp. 1520-1533, Oct. 2009.
    • (2009) IEEE Trans. Very Large Scale Integr. (VLSI) Syst. , vol.17 , Issue.10 , pp. 1520-1533
    • Herbert, S.1    Marculescu, D.2
  • 3
    • 59849116472 scopus 로고    scopus 로고
    • Process variation-aware timing optimization for dynamic and mixed-static-dynamic CMOS logic
    • Feb.
    • K. Yelamarthi and C.-I. H. Chen, "Process variation-aware timing optimization for dynamic and mixed-static-dynamic CMOS logic," IEEE Trans. Semicond. Manuf., vol. 22, no. 1, pp. 31-39, Feb. 2009.
    • (2009) IEEE Trans. Semicond. Manuf. , vol.22 , Issue.1 , pp. 31-39
    • Yelamarthi, K.1    Chen, C.-I.H.2
  • 5
    • 33846570414 scopus 로고    scopus 로고
    • Impact of supply voltage variations on full adder delay: Analysis and comparison
    • Dec.
    • M. Alioto and G. Palumbo, "Impact of supply voltage variations on full adder delay: Analysis and comparison," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 14, no. 12, pp. 1322-1335, Dec. 2006.
    • (2006) IEEE Trans. Very Large Scale Integr. (VLSI) Syst. , vol.14 , Issue.12 , pp. 1322-1335
    • Alioto, M.1    Palumbo, G.2
  • 7
    • 34249795033 scopus 로고    scopus 로고
    • Gate sizing: FinFET versus. 32nm bulk MOSFETs
    • Jul.
    • B. Swahn and S. Hassoun, "Gate sizing: FinFET versus. 32nm bulk MOSFETs," in Proc. Design Autom. Conf., Jul. 2006, pp. 528-531.
    • (2006) Proc. Design Autom. Conf , pp. 528-531
    • Swahn, B.1    Hassoun, S.2
  • 9
    • 77951014489 scopus 로고    scopus 로고
    • FinFET-based dynamic power management of on-chip interconnection networks through adaptive back-gate biasing
    • Oct.
    • C.-Y. Lee and N. K. Jha, "FinFET-based dynamic power management of on-chip interconnection networks through adaptive back-gate biasing," in Proc. Int. Conf. Comput. Design, Oct. 2009, pp. 350-357.
    • (2009) Proc. Int. Conf. Comput. Design , pp. 350-357
    • Lee, C.-Y.1    Jha, N.K.2
  • 10
    • 77952598728 scopus 로고    scopus 로고
    • Die-level leakage power analysis of FinFET circuits considering process variations
    • Mar.
    • P. Mishra, A. N. Bhoj, and N. K. Jha, "Die-level leakage power analysis of FinFET circuits considering process variations," in Proc. Int. Symp. Quality Electron. Design, Mar. 2010, pp. 347-355.
    • (2010) Proc. Int. Symp. Quality Electron. Design , pp. 347-355
    • Mishra, P.1    Bhoj, A.N.2    Jha, N.K.3
  • 11
    • 33846638697 scopus 로고    scopus 로고
    • A power delivery and decoupling network minimizing ohmic loss and supply voltage variation in silicon nanoscale technologies
    • Dec.
    • M. M. Budnik and K. Roy, "A power delivery and decoupling network minimizing ohmic loss and supply voltage variation in silicon nanoscale technologies," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 14, no. 12, pp. 1336-1346, Dec. 2006.
    • (2006) IEEE Trans. Very Large Scale Integr. (VLSI) Syst. , vol.14 , Issue.12 , pp. 1336-1346
    • Budnik, M.M.1    Roy, K.2
  • 12
    • 67349278213 scopus 로고    scopus 로고
    • Full-chip thermal analysis for the early design stage via general integral transforms
    • May
    • P.-Y. Huang and Y.-M. Lee, "Full-chip thermal analysis for the early design stage via general integral transforms," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 17, no. 5, pp. 613-626, May 2009.
    • (2009) IEEE Trans. Very Large Scale Integr. (VLSI) Syst. , vol.17 , Issue.5 , pp. 613-626
    • Huang, P.-Y.1    Lee, Y.-M.2
  • 13
  • 14
    • 77955105507 scopus 로고    scopus 로고
    • Improving the performance of GALS-based NoCs in the presence of process variation
    • May
    • C. Hernandez, A. Roca, F. Silla, J. Flich, and J. Duato, "Improving the performance of GALS-based NoCs in the presence of process variation," in Proc. Int. Symp. Netw. Chip, May 2010, pp. 35-42.
    • (2010) Proc. Int. Symp. Netw. Chip , pp. 35-42
    • Hernandez, C.1    Roca, A.2    Silla, F.3    Flich, J.4    Duato, J.5
  • 15
    • 44149117532 scopus 로고    scopus 로고
    • Impact of process and temperature variations on network-on-chip design exploration
    • Apr.
    • B. Li, L.-S. Peh, and P. Patra, "Impact of process and temperature variations on network-on-chip design exploration," in Proc. Int. Symp. Netw. Chip, Apr. 2008, pp. 117-126.
    • (2008) Proc. Int. Symp. Netw. Chip , pp. 117-126
    • Li, B.1    Peh, L.-S.2    Patra, P.3
  • 16
    • 79959216456 scopus 로고    scopus 로고
    • Design of ultra-low-leakage logic gates and flip-flops in high-performance FinFET technology
    • Mar.
    • A. N. Bhoj and N. K. Jha, "Design of ultra-low-leakage logic gates and flip-flops in high-performance FinFET technology," in Proc. Int. Symp. Quality Electron. Design, Mar. 2011, pp. 1-8.
    • (2011) Proc. Int. Symp. Quality Electron. Design , pp. 1-8
    • Bhoj, A.N.1    Jha, N.K.2
  • 18
    • 78650644644 scopus 로고    scopus 로고
    • Gated-diode Fin et DRAMs: Device and circuit design considerations
    • Dec.
    • A. N. Bhoj and N. K. Jha, "Gated-diode Fin ET DRAMs: Device and circuit design considerations," ACM J. Emerging Technol. Comput. Syst., vol. 6, no. 4, pp. 12:1-12:32, Dec. 2010.
    • (2010) ACM J. Emerging Technol. Comput. Syst. , vol.6 , Issue.4 , pp. 121-1232
    • Bhoj, A.N.1    Jha, N.K.2
  • 19
    • 80052672058 scopus 로고    scopus 로고
    • CACTI-FinFET: An integrated delay and power modeling framework for FinFET-based caches under process variations
    • Jun.
    • C.-Y. Lee and N. K. Jha, "CACTI-FinFET: An integrated delay and power modeling framework for FinFET-based caches under process variations," in Proc. Design Autom. Conf., Jun. 2011, pp. 866-871.
    • (2011) Proc. Design Autom. Conf , pp. 866-871
    • Lee, C.-Y.1    Jha, N.K.2
  • 20
    • 77949550376 scopus 로고    scopus 로고
    • FinFET-based power simulator for interconnection networks
    • Mar.
    • C.-Y. Lee and N. K. Jha, "FinFET-based power simulator for interconnection networks," ACM J. Emerging Technol. Comput. Syst., vol. 6, no. 1, pp. 2:1-2:18, Mar. 2010.
    • (2010) ACM J. Emerging Technol. Comput. Syst. , vol.6 , Issue.1 , pp. 21-218
    • Lee, C.-Y.1    Jha, N.K.2
  • 21
    • 34548124914 scopus 로고    scopus 로고
    • From finance to flip flops: A study of fast quasi-Monte Carlo methods from computational finance applied to statistical circuit analysis
    • Mar.
    • A. Singhee and R. A. Rutenbar, "From finance to flip flops: A study of fast quasi-Monte Carlo methods from computational finance applied to statistical circuit analysis," in Proc. Int. Symp. Quality Electron. Design, Mar. 2007, pp. 685-692.
    • (2007) Proc. Int. Symp. Quality Electron. Design , pp. 685-692
    • Singhee, A.1    Rutenbar, R.A.2
  • 24
    • 0030149507 scopus 로고    scopus 로고
    • CACTI: An enhanced cache access and cycle time model
    • May
    • S. J. E. Wilton and N. P. Jouppi, "CACTI: An enhanced cache access and cycle time model," IEEE J. Solid-State Circuits, vol. 31, no. 5, pp. 677-688, May 1996.
    • (1996) IEEE J. Solid-State Circuits , vol.31 , Issue.5 , pp. 677-688
    • Wilton, S.J.E.1    Jouppi, N.P.2
  • 25
    • 83455195319 scopus 로고    scopus 로고
    • 3D versus. 2D analysis of FinFET logic gates under process variations
    • Oct.
    • S. Chaudhuri and N. K. Jha, "3D versus. 2D analysis of FinFET logic gates under process variations," in Proc. Int. Conf. Comput. Design, Oct. 2011, pp. 435-436.
    • (2011) Proc. Int. Conf. Comput. Design , pp. 435-436
    • Chaudhuri, S.1    Jha, N.K.2
  • 27
    • 84899965580 scopus 로고    scopus 로고
    • (2006). Sentaurus TCAD Manuals [Online]. Available: http://www.synopsys. com
    • (2006) Sentaurus TCAD Manuals
  • 29
    • 27944470947 scopus 로고    scopus 로고
    • Full-chip analysis of leakage power under process variations, including spatial correlations
    • Jun.
    • H. Chang and S. S. Sapatnekar, "Full-chip analysis of leakage power under process variations, including spatial correlations," in Proc. Design Autom. Conf., Jun. 2005, pp. 523-528.
    • (2005) Proc. Design Autom. Conf , pp. 523-528
    • Chang, H.1    Sapatnekar, S.S.2
  • 31
    • 84875606509 scopus 로고    scopus 로고
    • FinPrin: Analysis and optimization of FinFET logic circuits under PVT variations
    • Jan.
    • Y. Yang and N. K. Jha, "FinPrin: Analysis and optimization of FinFET logic circuits under PVT variations," in Proc. Int. Conf. VLSI Design, Jan. 2013, pp. 350-355.
    • (2013) Proc. Int. Conf. VLSI Design , pp. 350-355
    • Yang, Y.1    Jha, N.K.2
  • 34
    • 47649089640 scopus 로고    scopus 로고
    • A high-performance, low leakage, and stable SRAM row-based back-gate biasing scheme in FinFET technology
    • Jan.
    • R. V. Joshi, K. Kim, R. Q. Williams, E. J. Nowak, and C.-T. Chuang, "A high-performance, low leakage, and stable SRAM row-based back-gate biasing scheme in FinFET technology," in Proc. Int. Conf. VLSI Design, Jan. 2007, pp. 665-672.
    • (2007) Proc. Int. Conf. VLSI Design , pp. 665-672
    • Joshi, R.V.1    Kim, K.2    Williams, R.Q.3    Nowak, E.J.4    Chuang, C.-T.5
  • 35
    • 67650242700 scopus 로고    scopus 로고
    • Low power 8T SRAM using 32nm independent gate FinFET technology
    • Sep.
    • Y. B. Kim, Y.-B. Kim, and F. Lombardi, "Low power 8T SRAM using 32nm independent gate FinFET technology," in Proc. Int. SoC Conf., Sep. 2008, pp. 247-250.
    • (2008) Proc. Int. SoC Conf , pp. 247-250
    • Kim, Y.B.1    Kim, Y.-B.2    Lombardi, F.3
  • 36
    • 0348040085 scopus 로고    scopus 로고
    • Statistical timing analysis for intra-die process variations with spatial correlations
    • Nov.
    • A. Agarwal, D. Blaauw, and V. Zolotov, "Statistical timing analysis for intra-die process variations with spatial correlations," in Proc. Int. Conf. Comput. Aided Design, Nov. 2003, pp. 900-907.
    • (2003) Proc. Int. Conf. Comput. Aided Design , pp. 900-907
    • Agarwal, A.1    Blaauw, D.2    Zolotov, V.3
  • 37
    • 0024913805 scopus 로고
    • Combinational profiles of sequential benchmark circuits
    • May
    • F. Brglez, D. Bryan, and K. Kozminski, "Combinational profiles of sequential benchmark circuits," in Proc. Int. Symp. Circuits Syst., May 1989, pp. 1929-1934.
    • (1989) Proc. Int. Symp. Circuits Syst , pp. 1929-1934
    • Brglez, F.1    Bryan, D.2    Kozminski, K.3
  • 38
    • 0004102542 scopus 로고
    • Timing models for MOS circuits
    • Literature, Stanford Univ., Stanford, CA, USA, Tech. Rep. SEL83-003
    • M. A. Horowitz, "Timing models for MOS circuits," ACM Guide Comput. Literature, Stanford Univ., Stanford, CA, USA, Tech. Rep. SEL83-003, 1983.
    • (1983) ACM Guide Comput
    • Horowitz, M.A.1
  • 39
    • 0028583468 scopus 로고
    • Comparison of methods of computing correlated lognormal sum distributions and outages for digital wireless applications
    • Jun.
    • A. A. Abu-Dayya and N. C. Beaulieu, "Comparison of methods of computing correlated lognormal sum distributions and outages for digital wireless applications," in Proc. Veh. Technol. Conf., Jun. 1994, pp. 175-179.
    • (1994) Proc. Veh. Technol. Conf , pp. 175-179
    • Abu-Dayya, A.A.1    Beaulieu, N.C.2
  • 40
    • 77953097586 scopus 로고    scopus 로고
    • Circuit propagation delay estimation through multivariate regression-based modeling under spatio-temporal variability
    • Mar.
    • S. Ganapathy, R. Canal, A. Gonzalez, and A. Rubio, "Circuit propagation delay estimation through multivariate regression-based modeling under spatio-temporal variability," in Proc. Design, Autom. Test Eur. Conf., Mar. 2010, pp. 417-422.
    • (2010) Proc. Design, Autom. Test Eur. Conf , pp. 417-422
    • Ganapathy, S.1    Canal, R.2    Gonzalez, A.3    Rubio, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.