Parameter variations and impact on circuits and microarchitecture

Proceedings - Design Automation Conference

Volumn , Issue , 2003, Pages 338-342

  Borkar, Shekhar ^a   Karnik, Tanay ^a   Narendra, Siva ^a   Tschanz, Jim ^a   Keshavarzi, Ali ^a   De, Vivek ^a  

^a INTEL CORPORATION   (United States)

Author keywords

Body bias; High performance deisgn; Parameter variation

Indexed keywords

LEAKAGE CURRENTS; MICROELECTRONICS; VLSI CIRCUITS;

MICROARCHITECTURE;

MICROPROCESSOR CHIPS;

EID: 0041633858     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/775832.775920     Document Type: Conference Paper

References (11)

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