Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 2003, Pages 900-907

  Agarwal, Aseem ^a   Blaauw, David ^a   Zolotov, Vladimir ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; DELAY CIRCUITS; GEOMETRY; LOGIC DESIGN; MONTE CARLO METHODS; PARAMETER ESTIMATION; PROBABILITY DISTRIBUTIONS;

GATE DELAYS; STATIC TIMING ANALYSIS (STA);

INTEGRATED CIRCUIT LAYOUT;

EID: 0348040085     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iccad.2003.159781     Document Type: Conference Paper

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