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Volumn 405, Issue 5, 2013, Pages 1479-1495

Structural and electronic characterization of self-assembled molecular nanoarchitectures by X-ray photoelectron spectroscopy

Author keywords

Monolayer; Nanoarchitecture; Self assembly; Sensing; XPS

Indexed keywords

FILM PREPARATION; MONOLAYERS; MULTILAYERS; PHOTOELECTRONS; PHOTONS; SELF ASSEMBLY;

EID: 84873737874     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-012-6394-8     Document Type: Review
Times cited : (91)

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