Application of XPS and ToF-SIMS for surface chemical analysis of DNA microarrays and their substrates

Analytical and Bioanalytical Chemistry

Volumn 393, Issue 8, 2009, Pages 1907-1912

  Graf, Nora ^a   Gross, Thomas ^a   Wirth, Thomas ^a   Weigel, Wilfried ^b   Unger, Wolfgang E S ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b SCIENION AG   (Germany)

Author keywords

Chemical imaging; Microarrays; Surface analysis; ToF SIMS; XPS

Indexed keywords

ATOMIC COMPOSITIONS; CHEMICAL COMPOSITIONS; CHEMICAL CONSTITUTIONS; CHEMICAL IMAGES; CHEMICAL IMAGING; CHEMICAL SURFACES; CONTACT-ANGLE MEASUREMENTS; DNA MICRO-ARRAYS; FUNCTIONAL SURFACES; FUNCTIONALIZED; HIGH RESOLUTIONS; LABEL-FREE; MICRO-METER SCALE; MICROARRAY EXPERIMENTS; MOLECULAR SPECIES; SPOT DETECTIONS; SURFACE CHEMICAL ANALYSIS; TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRIES; TOF-SIMS; X-RAY PHOTOELECTRON SPECTROSCOPIES; XPS; XPS IMAGING;

ANGLE MEASUREMENT; BIOASSAY; BIOCHIPS; CHEMICAL ANALYSIS; CONTACT ANGLE; DNA; GENES; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; MOLECULAR SPECTROSCOPY; NUCLEIC ACIDS; SECONDARY ION MASS SPECTROMETRY; SPECTRUM ANALYSIS; THICKNESS MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE ANALYSIS;

BACTERIAL DNA; SILANE DERIVATIVE;

ARTICLE; CHEMISTRY; DNA MICROARRAY; INSTRUMENTATION; MASS SPECTROMETRY; SPECTROPHOTOMETRY; STANDARD; SURFACE PROPERTY; TIME; X RAY;

DNA, BACTERIAL; OLIGONUCLEOTIDE ARRAY SEQUENCE ANALYSIS; SILANES; SPECTROMETRY, MASS, SECONDARY ION; SPECTROPHOTOMETRY; SURFACE PROPERTIES; TIME FACTORS; X-RAYS;

EID: 63449120097     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-009-2599-x     Document Type: Article

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