Surface composition, chemistry, and structure of polystyrene modified by electron-beam-generated plasma

Langmuir

Volumn 26, Issue 11, 2010, Pages 8857-8868

  Lock, Evgeniya H ^a   Petrovykh, Dmitri Y ^a,b   Mack, Paul ^c   Carney, Tim ^c   White, Richard G ^c   Walton, Scott G ^a   Fernsler, Richard F ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

^b Bldg 142   (United States)

^c Thermo Fisher Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL TECHNIQUES; ANGLE-RESOLVED XPS; AROMATIC CARBON; CHEMICAL COMPOSITIONS; CONTACT ANGLE GONIOMETRY; DEPTH PROFILE; ELECTRON-BEAM-GENERATED PLASMAS; ENTROPY ALGORITHMS; HYDROPHOBIC RECOVERY; NON DESTRUCTIVE; PLASMA TREATMENT; POLYMER SURFACES; REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPIES; SALIENT FEATURES; SURFACE COMPOSITIONS;

AROMATIC COMPOUNDS; AROMATIC POLYMERS; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CHEMICAL MODIFICATION; CONTACT ANGLE; ELECTRON ENERGY ANALYZERS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONS; ENERGY DISSIPATION; FLUORINE; HYDROPHOBICITY; NITROGEN PLASMA; OXYGEN; POLYSTYRENES; SURFACE CHEMISTRY; SURFACE MORPHOLOGY; SURFACE ROUGHNESS; SURFACE TENSION; UNSATURATED POLYMERS; X RAY PHOTOELECTRON SPECTROSCOPY;

PLASMA DIAGNOSTICS;

POLYSTYRENE DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; CHEMISTRY; ELECTRON; METHODOLOGY; SPECTROSCOPY; SURFACE PROPERTY; X RAY;

ELECTRONS; MICROSCOPY, ATOMIC FORCE; MOLECULAR STRUCTURE; POLYSTYRENES; SPECTRUM ANALYSIS; SURFACE PROPERTIES; X-RAYS;

EID: 77954558277     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la9046337     Document Type: Article

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