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Volumn 135, Issue 9, 2010, Pages 2273-2279

Viable route for switching of an engineered silica surface using Cu 2+ ions at sub-ppm levels

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EID: 77955811472     PISSN: 00032654     EISSN: 13645528     Source Type: Journal    
DOI: 10.1039/c0an00364f     Document Type: Article
Times cited : (25)

References (105)
  • 96
    • 33751537208 scopus 로고
    • D. Briggs and M. P. Seah, Wiley-VCH, Weinheim, Germany, 2nd edn
    • D. Briggs, in Practical Surfaces Analysis, ed., D. Briggs, and, M. P. Seah,, Wiley-VCH, Weinheim, Germany, 2nd edn, 1995, vol. 1, p. 244
    • (1995) Practical Surfaces Analysis, Ed. , vol.1 , pp. 244
    • Briggs In, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.