Chemically resolved electrical measurements using x-ray photoelectron spectroscopy

Applied Physics Letters

Volumn 85, Issue 7, 2004, Pages 1271-1273

  Cohen, Hagai ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICALLY RESOLVED ELECTRICAL MEASUREMENTS (CREM); CONTROLLED SURFACE CHARGING (CSC); ELECTRICAL RESPONSE; MULTICHANNEL VOLTMETERS; SURFACE CHARGE SPECTROSCOPY (SCS);

ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; ELECTROCHEMISTRY; ELECTRON GUNS; ELECTRON IRRADIATION; ELECTRONIC VOLTMETERS; KINETIC ENERGY; PHOTOVOLTAIC EFFECTS; SELF ASSEMBLY; SILANES; SILICON WAFERS; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROMETERS;

HETEROJUNCTIONS;

EID: 4444265240     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1782261     Document Type: Article

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