Chemically resolved electrical measurements in organic self-assembled molecular layers

Journal of Electron Spectroscopy and Related Phenomena

Volumn 176, Issue 1-3, 2010, Pages 24-34

  Cohen, Hagai ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

Charging; CREM; Electrical measurements; Molecular electronics; Self assembled monolayers (SAMs); X ray photoelectron spectroscopy (XPS)

Indexed keywords

ATOMIC RESOLUTION; ATOMIC SITES; CHARGING; DIPOLAR MOLECULES; DIRECT DETECTION; ELECTRICAL MEASUREMENT; ELECTRICAL STUDIES; ELECTROSTATIC POTENTIALS; EXTERNAL STIMULUS; FUTURE APPLICATIONS; GENERAL METHOD; HETEROSTRUCTURES; MOLECULAR ASSEMBLY; MOLECULAR LAYER; MOLECULAR POLARIZATION; NANOMETRICS; NON-CONTACT; ORGANIC SYSTEMS; PHOTO-INDUCED CHARGE; SAMS; SELF-ASSEMBLED; SUB-SURFACES; SURFACE CHARGING; WORK FUNCTION CHANGE;

CHARGED PARTICLES; ELECTRIC NETWORK ANALYSIS; ELECTRIC VARIABLES MEASUREMENT; MOLECULAR ELECTRONICS; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; SELF ASSEMBLED MONOLAYERS; SURFACE CHARGE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 71849095555     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2009.05.009     Document Type: Article

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