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Volumn 136, Issue 6, 2012, Pages

First principles analysis of the initial oxidation of Si(001) and Si(111) surfaces terminated with H and CH 3

Author keywords

[No Author keywords available]

Indexed keywords

A-DENSITY; ADSORBED OXYGEN; C-H BOND; COVERAGE-DEPENDENT DISSOCIATION; DISSOCIATIVE ADSORPTION; FIRST-PRINCIPLES; INITIAL OXIDATION; OXYGEN ATOM; SI (1 1 1); SI(0 0 1); SILICON SURFACES; THREE-STEP PROCESS; TRANSITION STATE;

EID: 84863125066     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3682782     Document Type: Conference Paper
Times cited : (7)

References (58)
  • 1
    • 35348909664 scopus 로고    scopus 로고
    • The high-k solution
    • DOI 10.1109/MSPEC.2007.4337663
    • M. Bohr, R. Chau, T. Ghani, and K. Mistry, IEEE Spectrum 44, 29 (2007). 10.1109/MSPEC.2007.4337663 (Pubitemid 47570274)
    • (2007) IEEE Spectrum , vol.44 , Issue.10 , pp. 29-35
    • Bohr, M.T.1    Chau, R.S.2    Ghani, T.3    Mistry, K.4
  • 3
    • 0036141466 scopus 로고    scopus 로고
    • Very low bulk and surface recombination in oxidized silicon wafers
    • DOI 10.1088/0268-1242/17/1/306, PII S0268124202263993
    • M. J. Kerr and A. Cuevas, Semicond. Sci. Technol. 17, 35 (2002). 10.1088/0268-1242/17/1/306 (Pubitemid 34080680)
    • (2002) Semiconductor Science and Technology , vol.17 , Issue.1 , pp. 35-38
    • Kerr, M.J.1    Cuevas, A.2
  • 4
    • 0034499742 scopus 로고    scopus 로고
    • 2 superlattices: Role of confined and defect states
    • DOI 10.1016/S0039-6028(00)00832-3
    • E. Degoli and S. Ossicini, Surf. Sci. 470, 32 (2000). 10.1016/S0039-6028(00)00832-3 (Pubitemid 32077294)
    • (2000) Surface Science , vol.470 , Issue.1-2 , pp. 32-42
    • Degoli, E.1    Ossicini, S.2
  • 8
    • 13444270619 scopus 로고    scopus 로고
    • Oxidation of the hydrogen terminated silicon surfaces by oxygen plasma investigated by in-situ infrared spectroscopy
    • DOI 10.1016/j.tsf.2004.08.054, PII S0040609004011666
    • M. Shinohara, T. Katagiri, K. Iwatsuji, Y. Matsuda, H. Fujiyama, Y. Kimura, and M. Niwano, Thin Solid Films 475, 128 (2005). 10.1016/j.tsf.2004.08. 054 (Pubitemid 40206302)
    • (2005) Thin Solid Films , vol.475 , Issue.SPEC. ISS. , pp. 128-132
    • Shinohara, M.1    Katagiri, T.2    Iwatsuji, K.3    Matsuda, Y.4    Fujiyama, H.5    Kimura, Y.6    Niwano, M.7
  • 10
    • 0030564301 scopus 로고    scopus 로고
    • Initial stage of oxidation of Si(100) surfaces in dry oxygen
    • DOI 10.1016/0169-4332(96)00312-1, PII S0169433296003121
    • K. Inanaga, T. Nakahata, T. Furukawa, and K. Ono, Appl. Surf. Sci. 100, 421 (1996). 10.1016/0169-4332(96)00312-1 (Pubitemid 126357833)
    • (1996) Applied Surface Science , vol.100-101 , pp. 421-424
    • Inanaga, K.1    Nakahata, T.2    Furukawa, T.3    Ono, K.4
  • 15
    • 0030564425 scopus 로고    scopus 로고
    • High purity ozone oxidation on hydrogen passivated silicon surface
    • DOI 10.1016/0169-4332(96)00315-7, PII S0169433296003157
    • A. Kurokawa and S. Ichimura, Appl. Surf. Sci. 100, 436 (1996). 10.1016/0169-4332(96)00315-7 (Pubitemid 126357836)
    • (1996) Applied Surface Science , vol.100-101 , pp. 436-439
    • Kurokawa, A.1    Ichimura, S.2
  • 17
    • 0037158940 scopus 로고    scopus 로고
    • Measuring the site-specific reactivity of impurities: The pronounced effect of dissolved oxygen on silicon etching
    • DOI 10.1021/jp0207073
    • S. P. Garcia, H. Bao, M. Manimaran, and M. A. Hines, J. Phys. Chem. B 106, 8258 (2002). 10.1021/jp0207073 (Pubitemid 35382930)
    • (2002) Journal of Physical Chemistry B , vol.106 , Issue.33 , pp. 8258-8264
    • Garcia, S.P.1    Bao, H.2    Manimaran, M.3    Hines, M.A.4
  • 24
    • 0030235747 scopus 로고    scopus 로고
    • Influences of hydrogen on initial oxidation processes of H-terminated Si(100) surfaces
    • DOI 10.1016/S0169-4332(96)00170-5, PII S0169433296001705
    • H. Ikeda, K. Hotta, S. Furuta, S. Zaima, and Y. Yasuda, Appl. Surf. Sci. 104, 354 (1996). 10.1016/S0169-4332(96)00170-5 (Pubitemid 126361439)
    • (1996) Applied Surface Science , vol.104-105 , pp. 354-358
    • Ikeda, H.1    Hotta, K.2    Furuta, S.3    Zaima, S.4    Yasuda, Y.5
  • 31
    • 0037149820 scopus 로고    scopus 로고
    • Attaching organic layers to semiconductor surfaces
    • DOI 10.1021/jp012995t
    • S. F. Bent, J. Phys. Chem. B 106, 2830 (2002). 10.1021/jp012995t (Pubitemid 35290292)
    • (2002) Journal of Physical Chemistry B , vol.106 , Issue.11 , pp. 2830-2842
    • Bent, S.F.1
  • 38
    • 18144380381 scopus 로고    scopus 로고
    • 2 on Si(100): The crucial step in the initial oxidation of a silicon surface
    • DOI 10.1103/PhysRevLett.94.016101, 016101
    • X. L. Fan, Y. F. Zhang, W. M. Lau, and Z. F. Liu, Phys. Rev. Lett. 94, 016101 (2005). 10.1103/PhysRevLett.94.016101 (Pubitemid 40620235)
    • (2005) Physical Review Letters , vol.94 , Issue.1 , pp. 1-4
    • Fan, X.L.1    Zhang, Y.F.2    Lau, W.M.3    Liu, Z.F.4
  • 39
    • 10944238868 scopus 로고    scopus 로고
    • Infrared intensities of v(Si-H) on H/Si(100)-2×1: Effect of O incorporation and agglomeration
    • DOI 10.1021/jp046808d
    • M. Halls and K. Raghavachari, J. Phys. Chem. B 108, 19388 (2004). 10.1021/jp046808d (Pubitemid 40011188)
    • (2004) Journal of Physical Chemistry B , vol.108 , Issue.50 , pp. 19388-19391
    • Halls, M.D.1    Raghavachari, K.2
  • 44
    • 0035883612 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.64.125322
    • T. Hoshino and Y. Nishioka, Phys. Rev. B 64, 125322 (2001). 10.1103/PhysRevB.64.125322
    • (2001) Phys. Rev. B , vol.64 , pp. 125322
    • Hoshino, T.1    Nishioka, Y.2
  • 46
    • 33645898818 scopus 로고
    • 10.1103/PhysRevB.45.13244
    • J. P. Perdew and Y. Wang, Phys. Rev. B 45, 13244 (1992). 10.1103/PhysRevB.45.13244
    • (1992) Phys. Rev. B , vol.45 , pp. 13244
    • Perdew, J.P.1    Wang, Y.2
  • 47
    • 34447260582 scopus 로고
    • 10.1063/1.458452
    • B. Delley, J. Chem. Phys. 92, 508 (1990). 10.1063/1.458452
    • (1990) J. Chem. Phys. , vol.92 , pp. 508
    • Delley, B.1
  • 49
    • 27744591635 scopus 로고    scopus 로고
    • A simplified eigenvector-following technique for locating transition points in an energy landscape
    • DOI 10.1021/jp053581t
    • J. C. Mauro, R. J. Loucks, and J. Balakrishnan, J. Phys. Chem. A 109, 9578 (2005). 10.1021/jp053581t (Pubitemid 41598541)
    • (2005) Journal of Physical Chemistry A , vol.109 , Issue.42 , pp. 9578-9583
    • Mauro, J.C.1    Loucks, R.J.2    Balakrishnan, J.3
  • 52
    • 85037874876 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.60.R8461
    • D.-S. Lin and R.-P. Chen, Phys. Rev. B 60, R8461 (1999). 10.1103/PhysRevB.60.R8461
    • (1999) Phys. Rev. B , vol.60 , pp. 8461
    • Lin, D.-S.1    Chen, R.-P.2
  • 54
    • 25744460922 scopus 로고
    • 10.1103/PhysRevB.50.17953
    • P. E. Blöchl, Phys. Rev. B 50, 17953 (1994). 10.1103/PhysRevB.50. 17953
    • (1994) Phys. Rev. B , vol.50 , pp. 17953
    • Blöchl, P.E.1
  • 55
    • 0030190741 scopus 로고    scopus 로고
    • Efficiency of ab-initio total energy calculations for metals and semiconductors using a plane-wave basis set
    • DOI 10.1016/0927-0256(96)00008-0, PII S0927025696000080
    • G. Kresse and J. Furthmüller, Comput. Mater. Sci. 6, 15 (1996). 10.1016/0927-0256(96)00008-0 (Pubitemid 126412269)
    • (1996) Computational Materials Science , vol.6 , Issue.1 , pp. 15-50
    • Kresse, G.1    Furthmuller, J.2


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