Chemical and electronic characterization of methyl-terminated Si(111) surfaces by high-resolution synchrotron photoelectron spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 72, Issue 4, 2005, Pages

  Hunger, Ralf ^a   Fritsche, Rainer ^a   Jaeckel, Bengt ^a   Jaegermann, Wolfram ^a   Webb, Lauren J ^b   Lewis, Nathan S ^b  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33749233464     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.045317     Document Type: Article

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