Initial oxidation of Si(100) -(2 × 1)H monohydride surfaces studied by scanning tunneling microscopy/scanning tunneling spectroscopy

Applied Surface Science

Volumn 117-118, Issue , 1997, Pages 114-118

  Ohmori, Kenji ^a   Ikeda, Hiroya ^a   Iwano, Hirotaka ^a   Zaima, Shigeaki ^a   Yasuda, Yukio ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Electronic states; Hydrogen termination; Microroughness; Oxidation; Scanning tunneling microscopy

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; FERMI LEVEL; HYDRIDES; HYDROGEN; HYDROGEN BONDS; OXIDATION; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS; SURFACE ROUGHNESS;

DIMERS; SCANNING TUNNELING SPECTROSCOPY (STS);

SEMICONDUCTING SILICON;

EID: 0031548140     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)80062-1     Document Type: Article

References (18)

1. J.A. Schaefer, D. Frankel, F. Stucki, W. Göpel, Surf. Sci. 139 (1984) L209.
2. H. Ikeda, K. Hotta, S. Furuta, S. Zaima, Y. Yasuda, Jpn. J. Appl. Phys. 35 (1996) 1069.
3. H. Ogawa, T. Hattori, Appl. Phys. Lett. 61 (1992) 577.
4. M. Niwano, J. Kageyama, K. Kinashi, J. Sawahata, N. Miyamoto, Surf. Sci. 301 (1994) L245.
5. J.J. Boland, J. Vac. Sci. Technol. A 10 (1991) 2458.
6. Ph. Avouris, I.-W. Lyo, F. Bozso, J. Vac. Sci. Technol. B 9 (1991) 424.
7. M. Udagawa, M. Niwa, I. Sumita, Jpn. J. Appl. Phys. 32 (1993) 282.
8. H. Ikegami, K. Ohmori, H. Ikeda, H. Iwano, S. Zaima, Y. Yasuda, Jpn. J. Appl. Phys. 35 (1996) 1593.
9. Y. Wang, M.J. Bronikowski, R.J. Hamers, J. Vac. Sci. Technol. A 12 (1994) 2051.
10. J.A. Appelbaum, G.A. Baraff, D.R. Hamann, Phys. Rev. B 14 (1976) 588.
11. R.J. Hamers, Ph. Avouris, F. Bozso, Phys. Rev. Lett. 59 (1987) 2071.
12. J.J. Boland, Phys. Rev. Lett. 67 (1991) 1539.
13. S. Ciraci, R. Butz, E.M. Oelling, H. Wagner, Phys. Rev. B 30 (1984) 711.
14. G. Li, R. Yia-Chung Chang, R. Tsu, J.E. Greene, Surf. Sci. 330 (1995) 20.
15. K. Hotta, H. Ikeda, S. Zaima and Y. Yasuda (unpublished).
16. K. Sinniah, L.B. Lewis, W.H. Weinberg, J.T. Yates Jr., K.C. Janda, Phys. Rev. Lett. 62 (1989) 567.
17. T. Uchiyama, T. Tsukada, J. Vac. Sci. Technol. B 12 (1994) 2205.
18. L.S.O. Johansson, R.I.G. Uhrberg, G.V. Hansson, Phys. Rev. B 38 (1988) 13490.