Backbond Oxidation of the Si(001) Surface: Narrow Channel of Barrierless Oxidation

Physical Review Letters

Volumn 80, Issue 9, 1998, Pages 2000-2003

  Kato, Koichi ^a   Uda, Tsuyoshi ^a   Terakura, Kiyoyuki ^b  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b NATL INST FOR ADV INTERDISC RES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001166607     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.80.2000     Document Type: Article

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