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Volumn 85, Issue 19, 2012, Pages

Transport properties of HfO 2-x based resistive-switching memories

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EID: 84861673464     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.195322     Document Type: Article
Times cited : (57)

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