SCOPUS 정보 검색 플랫폼

Volumn 89, Issue 10, 2006, Pages

Temperature dependence of transient and steady-state gate currents in HfO2 capacitors

b IFN CNR (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC CONDUCTANCE; ELECTRIC POTENTIAL; HAFNIUM COMPOUNDS; LEAKAGE CURRENTS; THERMAL EFFECTS;

CURRENT AMPLITUDE; GATE CURRENTS; STEADY-STATE CONDUCTION; TRANSIENT CURRENTS;

GATES (TRANSISTOR);

EID: 33748480913 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2345237 Document Type: Article

Times cited : (8)

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