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Volumn 78, Issue 23, 2008, Pages

Electric-field-induced submicrosecond resistive switching

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EID: 58149239895     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.235418     Document Type: Article
Times cited : (46)

References (20)
  • 14
    • 36149017207 scopus 로고
    • 10.1103/PhysRev.97.1538
    • A. Rose, Phys. Rev. 97, 1538 (1955). 10.1103/PhysRev.97.1538
    • (1955) Phys. Rev. , vol.97 , pp. 1538
    • Rose, A.1
  • 15
    • 33646647917 scopus 로고
    • For example, 10.1080/00207216608937906
    • For example, D. Dascalu, Int. J. Electron. 21, 183 (1966). 10.1080/00207216608937906
    • (1966) Int. J. Electron. , vol.21 , pp. 183
    • Dascalu, D.1
  • 17
    • 0032690319 scopus 로고    scopus 로고
    • For a general review on dielectric relaxation, 10.1088/0022-3727/32/14/ 201
    • For a general review on dielectric relaxation, A. K. Jonscher, J. Phys. D 32, R57 (1999). 10.1088/0022-3727/32/14/201
    • (1999) J. Phys. D , vol.32 , pp. 57
    • Jonscher, A.K.1
  • 18
    • 0001556021 scopus 로고
    • 10.1103/PhysRevB.18.5851
    • J. C. Kimball and L. W. Adams, Phys. Rev. B 18, 5851 (1978). 10.1103/PhysRevB.18.5851
    • (1978) Phys. Rev. B , vol.18 , pp. 5851
    • Kimball, J.C.1    Adams, L.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.