Theoretical prediction of intrinsic self-trapping of electrons and holes in monoclinic HfO2

Physical Review Letters

Volumn 99, Issue 15, 2007, Pages

  Munoz Ramo D ^a   Shluger, A L ^a   Gavartin, J L ^b   Bersuker, G ^c  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b Accelrys Limited UK   (United Kingdom)

^c SEMATECH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; ELECTRON TRAPS; HOLE CONCENTRATION; OPTICAL TRANSITIONS; OXYGEN; TENSORS;

ELECTRON POLARON; MONOCLINIC HFO2; OXYGEN SUBLATTICES; POLARON HOPPING;

HAFNIUM COMPOUNDS;

EID: 35248860269     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.99.155504     Document Type: Article

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