Artifact-free dynamic atomic force microscopy reveals monotonic dissipation for a simple confined liquid

Applied Physics Letters

Volumn 93, Issue 1, 2008, Pages

  Kaggwa, G B ^a   Kilpatrick, J I ^a   Sader, J E ^b   Jarvis, S P ^a  

^a UNIVERSITY COLLEGE DUBLIN   (Ireland)

^b UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; FLOW INTERACTIONS; FREQUENCY MODULATION; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; MODULATION; REUSABILITY; SCANNING PROBE MICROSCOPY; SEDIMENTATION;

AMERICAN INSTITUTE OF PHYSICS (AIP); CONFINED LIQUIDS; DYNAMIC ATOMIC FORCE MICROSCOPY; FORCE ANALYSIS; FREQUENCY-MODULATION ATOMIC FORCE MICROSCOPY (FM-AFM); PHASE ERROR (PE); PHASE OFFSETS;

ERROR ANALYSIS;

EID: 47249135377     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2950324     Document Type: Article

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