Frequency modulation atomic force microscopy in ambient environments utilizing robust feedback tuning

Review of Scientific Instruments

Volumn 80, Issue 2, 2009, Pages

  Kilpatrick, J I ^a   Gannepalli, A ^b   Cleveland, J P ^b   Jarvis, S P ^a  

^a UNIVERSITY COLLEGE DUBLIN   (Ireland)

^b United States   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL SYSTEMS; DEMODULATION; FREQUENCY MODULATION; NANOCANTILEVERS; NATURAL FREQUENCIES; TELECOMMUNICATION SYSTEMS;

AFM; AFM IMAGES; AMBIENT ENVIRONMENTS; BIOLOGICAL SAMPLES; COMPLEX BIOLOGICAL SYSTEMS; CONSTANT AMPLITUDES; DEFAULT VALUES; ENHANCED STABILITIES; EXPERIMENTAL DATUM; FEED-BACK LOOPS; FEEDBACK GAINS; FREQUENCY MODULATION ATOMIC FORCE MICROSCOPIES; HIGH-RESOLUTION IMAGING; IMAGING ARTIFACTS; MC3T3-E1; NANO-SCALE; OPERATIONAL BANDWIDTHS; PHYSIOLOGICAL ENVIRONMENTS; QUANTITATIVE ANALYSIS; RESONANT FREQUENCIES;

ATOMIC FORCE MICROSCOPY;

EID: 61449132472     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3073964     Document Type: Article

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