Invited article: VEDA: A web-based virtual environment for dynamic atomic force microscopy

Review of Scientific Instruments

Volumn 79, Issue 6, 2008, Pages

  Melcher, John ^a   Hu, Shuiqing ^a   Raman, Arvind ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; DYNAMICS; EXTRACTION; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY; STANDARDS; TOOLS; WEB BROWSERS;

(E ,2E) THEORY; ACCURATE SIMULATION; AMERICAN INSTITUTE OF PHYSICS (AIP); CYBERINFRASTRUCTURE (CI); DYNAMIC ATOMIC FORCE MICROSCOPY; HIGH FIDELITY; MATE RIAL PROPERTIES; OPTIMAL PROBE; POWER DISSIPATIONS; SIMULATION TOOLS; TERAGRID; TIP SAMPLE INTERACTIONS; VIRTUAL ENVIRONMENT (VE); WIDE-RANGE;

VIRTUAL REALITY;

EID: 46449091843     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2938864     Document Type: Article

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