Adhesion hysteresis in dynamic atomic force microscopy

Physica Status Solidi - Rapid Research Letters

Volumn 2, Issue 3, 2008, Pages 138-140

  Kóber, Mariana ^a   Sahagún, Enrique ^b   Fuss, Martina ^a   Briones, Fernando ^a   Luna, Móica ^a   Sánz, Juan José ^b  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION HYSTERESIS; DYNAMIC ATOMIC FORCE MICROSCOPY; FORCE MICROSCOPY; INTERACTION FORCES; NUMERICAL SIMULATION; POWER DISSIPATION; TIP-SAMPLE INTERACTION;

ADHESION; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELECTRIC POWER UTILIZATION;

HYSTERESIS;

EID: 67650558576     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.200802033     Document Type: Article

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