Quantitative force and dissipation measurements in liquids using piezo-excited atomic force microscopy: A unifying theory

Nanotechnology

Volumn 22, Issue 48, 2011, Pages

  Kiracofe, Daniel ^a   Raman, Arvind ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC EXCITATION; AFM; AFM IN LIQUID; BASE MOTION; DISSIPATION MEASUREMENTS; DYNAMIC ATOMIC FORCE MICROSCOPY; EXCITATION FORCE; FORCE GRADIENTS; LIQUID CELLS; LIQUID ENVIRONMENT; MICRO-CANTILEVERS; OCTAMETHYLCYCLOTETRASILOXANE; PIEZOELECTRIC ELEMENTS; QUANTITATIVE FORCES; SCANNING LASER DOPPLER VIBROMETERS; SOLVATION SHELL;

ACOUSTIC SPECTROSCOPY; ACOUSTIC WAVE TRANSMISSION; ACOUSTICS; ATOMIC FORCE MICROSCOPY; ENERGY DISSIPATION; MICA; NANOCANTILEVERS;

LIQUIDS;

EID: 80855144791     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/48/485502     Document Type: Article

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