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Ultramicroscopy

Volumn 86, Issue 1-2, 2001, Pages 207-215

Thermomechanical noise of a free v-shaped cantilever for atomic-force microscopy

(3) Stark, Robert W a Drobek, Tanja a Heckl, Wolfgang M a

a UNIVERSITY OF MUNICH (Germany)

Author keywords

Atomic force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; CANTILEVER; CONFERENCE PAPER; DEVICE; SIGNAL NOISE RATIO; TECHNIQUE; THEORY; THERMOMICROSCOPY;

EID: 0035136028 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(00)00077-2 Document Type: Conference Paper

Times cited : (149)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.