Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever

Applied Physics Letters

Volumn 84, Issue 3, 2004, Pages 449-451

  Rodríguez, Tomás R ^a   García, Ricardo ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AMPLITUDE MODULATION; ATOMIC FORCE MICROSCOPY; BOUNDARY CONDITIONS; CANTILEVER BEAMS; COMPUTER SIMULATION; DAMPING; ENERGY DISSIPATION; IMAGE ANALYSIS; OSCILLATIONS; PHASE SHIFT; RUNGE KUTTA METHODS; VAN DER WAALS FORCES;

HYDRODYNAMIC DAMPING; MICROCANTILEVERS; NEWTON EQUATION;

SURFACE STRUCTURE;

EID: 2642571726     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1642273     Document Type: Article

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