Multiple impact regimes in liquid environment dynamic atomic force microscopy

Applied Physics Letters

Volumn 93, Issue 9, 2008, Pages

  Melcher, John ^a   Xu, Xin ^a   Raman, Arvind ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMS; CYTOLOGY; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY;

DYNAMIC ATOMIC FORCE MICROSCOPY; LIQUID ENVIRONMENTS; LOW-QUALITY;

BIOLOGICAL MEMBRANES;

EID: 51349160066     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2976438     Document Type: Article

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