Direct mapping of the solid-liquid adhesion energy with subnanometre resolution

Nature Nanotechnology

Volumn 5, Issue 6, 2010, Pages 401-405

  Voïtchovsky, Kislon ^a   Kuna, Jeffrey J ^a   Contera, Sonia Antoranz ^b   Tosatti, Erio ^c,d,e   Stellacci, Francesco ^a,f  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c SISSA   (Italy)

^d ABDUS SALAM INTERNATIONAL CENTRE FOR THEORETICAL PHYSICS   (Italy)

^e DEMOCRITOS NATIONAL SIMULATION CENTER   (Italy)

^f EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; INTERFACIAL ENERGY; LIQUIDS; WETTING;

CALIBRATION CURVES; DIFFRACTION TECHNIQUES; LATERAL RESOLUTION; MOLECULAR RESOLUTION; SOLID-LIQUID INTERFACES; SUBNANOMETRE RESOLUTION; SURFACE ELECTROCHEMISTRY; TOPOGRAPHIC IMAGES;

PHASE INTERFACES;

ADHESION; ARTICLE; ATOMIC FORCE MICROSCOPY; ENERGY; IMAGE ANALYSIS; LIQUID; MODULATION; NANOANALYSIS; PRIORITY JOURNAL; SOLID; TOPOGRAPHY;

EID: 77955195011     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2010.67     Document Type: Article

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