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Volumn 133, Issue 47, 2011, Pages 19168-19177

All-carbon molecular tunnel junctions

Author keywords

[No Author keywords available]

Indexed keywords

CONVENTIONAL MICROELECTRONICS; COVALENT BONDING; DISORDERED CARBON; ENHANCED STABILITY; HIGH YIELD; IN-VACUUM; J-V CHARACTERISTICS; MOLECULAR ELECTRONIC JUNCTION; MOLECULAR JUNCTION; MOLECULAR LAYER; ORGANIC MOLECULES; REPRODUCIBILITIES; TOP CONTACT;

EID: 81855199929     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja206619a     Document Type: Article
Times cited : (97)

References (99)
  • 12
    • 0042322640 scopus 로고    scopus 로고
    • Xu, B.; Tao, N. J. Science 2003, 301, 1221-1223
    • (2003) Science , vol.301 , pp. 1221-1223
    • Xu, B.1    Tao, N.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.