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Volumn 126, Issue 50, 2004, Pages 16621-16631

In situ Raman spectroscopy of bias-induced structural changes in nitroazobenzene molecular electronic junctions

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC POTENTIAL; ELECTROCHEMISTRY; MOLECULAR STRUCTURE; OXIDATION; RAMAN SPECTROSCOPY; SEMICONDUCTOR JUNCTIONS; TITANIUM OXIDES;

EID: 11444254794     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja045763r     Document Type: Article
Times cited : (96)

References (63)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.