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Volumn 112, Issue 25, 2008, Pages 9474-9485

Comprehensive characterization of hybrid junctions comprised of a porphyrin monolayer sandwiched between a coinage metal overlayer and a Si(100) substrate

Author keywords

[No Author keywords available]

Indexed keywords

ALLYL GROUPS; ATOMIC FORCE; AU FILMS; COMPREHENSIVE ASSESSMENTS; CURRENT-VOLTAGE MEASUREMENTS; DEPOSITED METALS; ELECTRICALLY CONDUCTIVE; FT-IR SPECTROSCOPY; HYBRID JUNCTIONS; MESO POSITIONS; METAL CONTACTS; METAL DEPOSITIONS; P-PHENYLENE; P-TOLYL; PENTAFLUOROPHENYL; PORPHYRIN MONOLAYERS; SI (100) SUBSTRATE; SI SUBSTRATE; SI(1 0 0);

EID: 53549091870     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp802428y     Document Type: Article
Times cited : (11)

References (61)
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    • Scott, A.; Janes, D. B.; Risko, C.; Ratner, M. A. Appl. Phys. Lett. 2007, 91, 0335081-0335083.
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    • Buriak, J. M. Chem. Rev. 2002, 102, 1271-1308.
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    • Buriak, J.M.1
  • 61
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    • Wagner, C. D, Riggs, W. M, Davis, L. E, Moulder, J. F, Muilenberg, G. E, Eds, Perkin-Elmer Corp, Eden Prairie, MN
    • Handbook of X-Ray Photoelectron Spectroscopy; Wagner, C. D., Riggs, W. M., Davis, L. E., Moulder, J. F., Muilenberg, G. E., Eds.; Perkin-Elmer Corp.: Eden Prairie, MN, 1978.
    • (1978) Handbook of X-Ray Photoelectron Spectroscopy


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.