Diffusivity of Cu ions in solid electrolyte and its effect on the performance of nanometer-scale switch

IEEE Transactions on Electron Devices

Volumn 55, Issue 11, 2008, Pages 3283-3287

  Banno, Naoki ^a   Sakamoto, Toshitsugu ^a   Iguchi, Noriyuki ^a   Sunamura, Hiroshi ^b   Terabe, Kazuya ^c   Hasegawa, Tsuyoshi ^c   Aono, Masakazu ^c  

^a NEC CORPORATION   (Japan)

^b RENESAS TECHNOLOGY CORP   (Japan)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Electrochemical devices; Ions; Programmable logic device; Switches

Indexed keywords

CLARIFICATION; DISSOLUTION; ELECTROLYTES; IONS; LOGIC DEVICES; RATE CONSTANTS; SOLID ELECTROLYTES; SWITCHES; TANTALUM;

CONDUCTANCE STATES; CU IONS; ELECTROCHEMICAL DEVICES; ELECTROCHEMICAL REACTIONS; ION DIFFUSION COEFFICIENTS; ION MIGRATIONS; LOGIC APPLICATIONS; LOGIC OPERATIONS; MIGRATION RATES; NON VOLATILES; PROGRAMMABLE LOGIC DEVICE; SWITCHING PROCESSES;

ELECTROLYSIS;

EID: 56549119052     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2008.2004246     Document Type: Article

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