Soft contact deposition onto molecularly modified GaAs. Thin metal film flotation: Principles and electrical effects

Advanced Functional Materials

Volumn 12, Issue 11-12, 2002, Pages 795-807

  Vilan, Ayelet ^a   Cahen, David ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; FLOTATION; INTERFACES (MATERIALS); LITHOGRAPHY; MONOLAYERS; SELF ASSEMBLY; SEMICONDUCTING GALLIUM ARSENIDE; SINGLE CRYSTALS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

WAFER BONDING;

METALLIC FILMS;

EID: 0037231006     PISSN: 1616301X     EISSN: None     Source Type: Journal    
DOI: 10.1002/adfm.200290009     Document Type: Article

References (72)

1. P. A. Packan, Science 1999, 285, 2079.
2. A. Aviram, M. A. Ratner, Chem. Phys. Lett. 1974, 29, 277.
3. D. Porath, A. Bezryadin, S. de Vries, C. Dekker, Nature 2000, 403, 635.
4. H. Park, J. Park, A. K. L. Lim, E. H. Anderson, A. P. Alivisatos, P. L. McEuen, Nature 2000, 407, 57.
5. J. Chen, W. Wang, M. A. Reed, A. M. Rawlett, D. W. Price, J. M. Tour, Appl. Phys. Lett. 2000, 77, 1224.
6. C. P. Collier, G. Mattersteig, E. W. Wong, Y. Luo, K. Beverly, J. Sampaio, F. M. Raymo, J. F. Stoddart, J. R. Heath, Science 2000, 289, 1172.
7. See also the issue of Chem. Phys. 2002, 281 (2-3), pp. 111-487, for a recent summary of much of the theoretical and experimental activities.
8. S. Forrest, P. Burrows, M. Thompson, IEEE Spectr. 2000, 37, 29.
9. L. M. Greig, D. Philp, Chem. Soc. Rev. 2001, 30, 287.
10. D. H. Gracias, J. Tien, T. L. Breen, C. Hsu, G. M. Whitesides, Science 2000, 289, 1170.
11. N. B. Bowden, M. Weck, I. S. Choi, G. M. Whitesides, Acc. Chem. Res. 2001, 34, 231.
12. D. Cahen, G. Hodes, Adv. Mater. 2002, 11, 789.
13. E. Braun, Y. Eichen, U. Sivan, G. Ben-Yoseph, Nature 1998, 391, 775.
14. K. D. Hermanson, S. O. Lumsdon, J. P. Williams, E. W. Kaler, O. D. Velev, Science 2001, 294, 1082.
15. J. L. Miles, H. O. McMahon, J. Appl. Phys. 1961, 32, 1176.
16. E. E. Polymeropoulos, J. Sagiv, J. Chem. Phys. 1978, 69, 1836.
17. R. Tredgold, A. Vickers, R. Allen, J. Phys. D 1984, 17, L5.
18. E. Itoh, M. Iwamoto, J. Appl. Phys. 1999, 85, 7239.
19. C. M. Fischer, M. Burghard, S. Roth, Synth. Met. 1996, 76, 237.
20. I. G. Hill, A. Rajagopal, A. Kahn, J. Appl. Phys. 1998, 84, 3236.
21. A. Hooper, G. L. Fisher, K. Konstadinidis, D. Jung, H. Nguyen, R. Opila, R. W. Collins, N. Winograd, D. L. Allara, J. Am. Chem. Soc. 1999, 121, 8052.
22. R. Hang, M. A. Rampi, R. E. Holmlin, G. M. Whitesides, J. Am. Chem. Soc. 1999, 121, 7895.
23. K. Slowinski, H. K. Y. Fong, M. Majda, J. Am. Chem. Soc. 1999, 121, 7257.
24. R. E. Holmlin, R. F. Ismagilov, R. Haag, V. Mujica, M. A. Ratner, M. A. Rampi, G. M. Whitesides, Angew. Chem. Int. Ed. 2001, 40, 2316.
25. D. Gal, E. Sone, R. Cohen, G. Hodes, J. Libman, A. Shanzer, H. W. Schock, D. Cahen, Proc. Ind. Acad. Sci. Chem. Sci. 1997, 109, 487.
26. Y. Golan, L. Margulis, I. Rubinstein, Surf. Sci. 1992, 264, 312.
27. G. A. Antypas, J. Edgecumbe, Appl. Phys. Lett. 1974, 26, 371.
28. E. Yablonovitch, T. Gmitter, J. P. Harbison, R. Bhat, Appl. Phys. Lett. 1987, 51, 2222.
29. Z. L. Lieu, D. E. Mull, Appl. Phys. Lett. 1990, 56, 737.
30. A. Plossl, G. Krauter, Mater. Sci. Eng. 1999, R25, 1.
31. E. Yablonovitch, D. M. Hwang, T. J. Gmitter, L. T. Florez, J. P. Harbison, Appl. Phys. Lett. 1990, 56, 2419.
32. Z. L. Lieu, Appl. Phys. Lett. 2000, 77, 651.
33. Y. Xia, B. Gates, Y. D. Yin, Y. Lu, Adv. Mater. 2000, 12, 693.
34. Y. D. Yin, Y. Lu, B. Gates, Y. Xia, J. Am. Chem. Soc. 2001, 123, 8718.
35. P. A. Kralchevsky, K. Nagayama, Adv. Colloid Interface Sci. 2000, 85, 145.
36. D. W. Murphy, J. G. W. Hull, J. Chem. Phys. 1975, 62, 973.
37. R. A. Gordon, D. Yang, E. D. Crozier, D. T. Jiang, R. F. Frindt, Phys. Rev. B 2002, 65, 5407.
38. We use the term molecular layer (MoL) instead of monolayer (ML), to stress the difference between these layers, on the one hand, and near-perfectly ordered monolayers with both local and long-range order, on the other hand. In our case, there is average order, perpendicular to the binding surface, because we use ligands with a well-defined binding site. We followed adsorption procedures to avoid multilayers on the surface. Total coverage can vary from 0.75 to 1 monolayer, depending on the binding groups, substituents and substrate.
39. Note that Figure Id shows the most complicated case, where MoLs are adsorbed on both the metal leaf and on the substrate. The simpler cases are those where a MoL is adsorbed on either of these. All cases are considered here.
40. R. Maoz, J. Sagiv, J. Colloid Interface Sci. 1984, 100, 465.
41. A. Ulman, An Introduction to Ultrathin Organic Films, Academic Press, New York 1991.
42. G. M. Kim, B. Kim, M. Liebau, J. Huskens, D. N. Reinhoudt, J. Brugger, IEEE J. Microelectromech. Syst. 2002, 11, 175.
43. S. D. Evans, E. Urankar, A. Ulman, N. Ferris, J. Am. Chem. Soc. 1991, 113, 4121.
44. a) Y. Selzer, D. Cahen, Adv. Mater. 2001, 13, 508.
45. b) E. Moons, M. Bruening, A. Shanzer, J. Bierer, D. Cahen, Synth. Met. 1996, 76, 245.
46. S. Seker, K. Meeker, T. F. Keuch, A. B. Ellis, Chem. Rev. 2000, 100, 2505.
47. M. Bruening, E. Moons, D. Cahen, A. Shanzer, J. Phys. Chem. 1995, 99, 8368.
48. R. Cohen, S. Bastide, D. Cahen, J. Libman, A. Shanzer, Y. Rosenwaks, Adv. Mater. 1997, 9, 746.
49. R. Cohen, L. Kronik, A. Shanzer, D. Cahen, A. Liu, Y. Rosenwaks, J. Lorenz, A. B. Ellis, J. Am. Chem. Soc. 1999, 121, 10545.
50. A. Vilen, R. Ussyshkin, K. Gartsman, D. Cahen, R. Naaman, A. Shanzer, J. Phys. Chem. 1998, 102, 3307.
51. G. Ashkenasy, D. Cahen, R. Cohen, A. Shanzer, A. Vilan, Acc. Chem. Res. 2002, 35, 121.
52. M. Bruening, R. Cohen, J. F. Guillemoles, T. Moav, J. Libman, A. Shanzer, D. Cahen, J. Am. Chem. Soc. 1997, 119, 5720.
53. a) A. Salomon, M.Sc. Thesis, Weizmann Institute of Science, Rehovot 2001.
54. b) A. Salomon, D. Berkovitz, D. Cahen, unpublished.
55. D. Bonifazi, A. Salomon, O. Enger, F. Diederich, D. Cahen, Adv. Mater. 2002, 14, 802.
56. A. Vilan, A. Shanzer, D. Cahen, Nature 2000, 404, 166.
57. D. G. Wu, J. Ghabboun, J. M. L. Martin, D. Cahen, J. Phys. Chem. B 2001, 105, 12011.
58. a) A. Vilan, Ph.D. Thesis, Weizmann Institute of Science, Rehovot 2002.
59. b) A. Vilan, J. Ghabboun, D. Cahen, unpublished.
60. J. N. Israelachvili, Intermolecular and Surface Forces, 2nd ed., Academic Press, London 1991.
61. J. C. Berg, in Wettability, Surfactant Science Series, Vol. 49 (in series) (Ed: J. C. Berg), Marcel Dekker, New York 1993, Ch. 2.
62. M. J. Jaycock, G. D. Parfitt, Chemistry of Interfaces, Ellis Horwood, Chichester 1981.
63. P. A. Kralchevsky, V. N. Paunov, N. D. Denkov, K. Nagayama, J. Colloid Interface Sci. 1994, 167, 47.
64. A. W. Adamson, A. P. Gast, Physical Chemistry of Surfaces, 6th ed., Wiley, New York 1997.
65. Q. Guo, C. Arnoux, R. E. Palmer, Langmuir 2001, 17, 7150.
66. C. J. Zhong, W. X. Zheng, F. L. Leibowitz, Electrochem. Solid-State Commun. 1999, 1, 72.
67. I. B. Ivanov, D. S. Dimitrov, in Thin Liquid Films, Surfactant Science Series, Vol. 29 (in series) (Ed: I. B. Ivanov), Marcel Dekker, New York 1988, p. 379 ff.
68. R. Yerushalmi-Rozen, 2002, private communication.
69. C. Joachim, J. K. Gimzewski, A. Aviram, Nature 2000, 408, 541.
70. X. D. Cui, A. Primak, X. Zarate, J. Tomfohr, O. F. Sankey, A. L. Moore, T. A. Moore, D. Gust, G. Harris, S. M. Lindsay, Science 2001, 294, 571.
71. H. L. Anderson, Physics Vade Mecum, American Institute of Physics, New York 1981.
72. D. R. Lide, CRC Handbook of Chemistry and Physics, 73th ed., CRC Press, Boca Raton, FL 1994.