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Volumn 50, Issue 8 PART 4, 2011, Pages

Photoassisted Kelvin probe force microscopy on multicrystalline Si solar cell materials

Author keywords

[No Author keywords available]

Indexed keywords

ABRUPT CHANGE; CARRIER RECOMBINATION; DIFFUSION LENGTH; INCIDENT LIGHT; INTRINSIC SURFACES; KELVIN PROBE FORCE MICROSCOPY; LEAKAGE PATHS; MINORITY CARRIER; MINORITY CARRIER DIFFUSION LENGTH; MODULATION FREQUENCIES; MULTICRYSTALLINE SI; PHOTO-VOLTAGE; PHOTOVOLTAIC MEASUREMENTS; POTENTIAL PROFILES; SOLAR CELL PERFORMANCE;

EID: 80051955968     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.50.08LA05     Document Type: Conference Paper
Times cited : (16)

References (45)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.