Minority carrier lifetime in polycrystalline silicon solar cells studied by photoassisted Kelvin probe force microscopy

Applied Physics Letters

Volumn 93, Issue 2, 2008, Pages

  Takihara, Masaki ^a   Takahashi, Takuji ^a   Ujihara, Toru ^b  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AGRICULTURAL PRODUCTS; CIVIL AVIATION; CRYSTAL GROWTH; DIRECT ENERGY CONVERSION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; NONMETALS; PHOTOVOLTAIC CELLS; POLYCRYSTALLINE MATERIALS; POLYSILICON; SILICON; SILICON SOLAR CELLS; SOLAR CELLS; SOLAR ENERGY; SOLAR EQUIPMENT;

AMERICAN INSTITUTE OF PHYSICS (AIP); KELVIN PROBE FORCE MICROSCOPY (KPFM); MINORITY CARRIER LIFETIMES; PHOTOVOLTAGE (PV); PHOTOVOLTAGE MEASUREMENTS; POLY CRYSTALLINE; POLYCRYSTALLINE SILICON SOLAR CELLS;

CARRIER LIFETIME;

EID: 47549099183     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2957468     Document Type: Article

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