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Volumn , Issue , 2009, Pages 000561-000563

Photovoltaic characterization of Cu(lnGa)Se2 and Cu(lnAl)Se 2 solar cells by photoassisted kelvin probe force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ABRUPT DROPS; KELVIN PROBE FORCE MICROSCOPY; PHOTO-VOLTAGE; POTENTIAL DISTRIBUTIONS; THIN FILM SOLAR CELLS; TYPICAL VALUES;

EID: 77951604004     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2009.5411620     Document Type: Conference Paper
Times cited : (8)

References (14)
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    • Jiang, C.-S.1
  • 8
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  • 9
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    • T. Igarashi et aI., "Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by Atomic Force Microscopy with Piezoresistive Cantilever", Jpn. J. Appl. Phys., 45, 2128 (2006).
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  • 10
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    • M. Takihara et aI., "Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy with Piezoresistive Cantilever", Jpn. J. Appl. Phys., 46, 5548 (2007).
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  • 11
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    • Minority carrier lifetime in polycrystalline silicon solar cells studied by photoassisted Kelvin probe force microscopy
    • M. Takihara et ai, "Minority carrier lifetime in polycrystalline silicon solar cells studied by photoassisted Kelvin probe force microscopy", Appl. Phys. Lett., 93, 021902 (2008).
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  • 12
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.