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Volumn 45, Issue 3 B, 2006, Pages 2128-2131

Photovoltage mapping on polycrystalline silicon solar cells through potential measurements by atomic force microscopy with piezoresistive cantilever

Author keywords

Photovoltage; Piezoresistive cantilever; Polycrystalline silicon; Solar cell

Indexed keywords

ATOMIC FORCE MICROSCOPY; LIGHT REFLECTION; LIGHTING; MAPPING; POLYSILICON;

EID: 33645531405     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.2128     Document Type: Article
Times cited : (15)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.