|
Volumn 45, Issue 3 B, 2006, Pages 2128-2131
|
Photovoltage mapping on polycrystalline silicon solar cells through potential measurements by atomic force microscopy with piezoresistive cantilever
|
Author keywords
Photovoltage; Piezoresistive cantilever; Polycrystalline silicon; Solar cell
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
LIGHT REFLECTION;
LIGHTING;
MAPPING;
POLYSILICON;
LIGHT ILLUMINATION;
PHOTOVOLTAGE;
PIEZORESISTIVE CANTILEVERS;
SILICON SOLAR CELLS;
|
EID: 33645531405
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.45.2128 Document Type: Article |
Times cited : (15)
|
References (10)
|