Photovoltage mapping on polycrystalline silicon solar cells by Kelvin probe force microscopy with piezoresistive cantilever

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 8 B, 2007, Pages 5548-5551

  Takihara, Masaki ^a   Igarashi, Takatoshi ^a   Ujihara, Toru ^b   Takahashi, Takuji ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

Grain boundary; Kelvin probe force microscopy (KFM); Photovoltage; Piezoresistive cantilever; Polycrystalline silicon; Solar cell

Indexed keywords

GRAIN BOUNDARIES; MICROSCOPIC EXAMINATION; POLYSILICON;

KELVIN PROBE FORCE MICROSCOPY; PHOTOVOLTAGE MAPPING; PIEZORESISTIVE CANTILEVER;

SOLAR CELLS;

EID: 34548233762     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.5548     Document Type: Article

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