Easy-to-use surface passivation technique for bulk carrier lifetime measurements on silicon wafers

Progress in Photovoltaics: Research and Applications

Volumn 6, Issue 4, 1998, Pages 259-263

  Schmidt, Jan ^a   Aberle, Armin G ^a  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL CLEANING; CRYSTALLINE MATERIALS; DEPOSITION; ELECTRIC CORONA; PASSIVATION; PHOTOCONDUCTIVITY; VARNISH;

PHOTOCONDUCTANCE DECAY (PCD) TECHNIQUE;

SILICON WAFERS;

EID: 0032120639     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-159X(199807/08)6:4<259::AID-PIP215>3.0.CO;2-Z     Document Type: Article

References (14)

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