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Volumn 74, Issue 1-4, 2002, Pages 183-193

Spatial distribution of minority-carrier lifetime and local concentration of impurities in multicrystalline silicon solar cells

Author keywords

Distribution; Grain boundary; Iron; Lifetime; Multicrystalline silicon; Segregation; SIMS; Solar cell

Indexed keywords

CRYSTAL IMPURITIES; CRYSTALLINE MATERIALS; GRAIN BOUNDARIES; IRON; SECONDARY ION MASS SPECTROMETRY; SEGREGATION (METALLOGRAPHY);

EID: 0036778467     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(02)00063-6     Document Type: Article
Times cited : (10)

References (4)
  • 3
    • 17544373064 scopus 로고
    • Switching time in junction diodes and junction transistors
    • (1954) Proc. IRE , vol.42 , pp. 829-834
    • Kingston, R.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.