Measurements of potential barrier height of grain boundaries in polycrystalline silicon by Kelvin probe force microscopy

Philosophical Magazine Letters

Volumn 85, Issue 1, 2005, Pages 41-49

  Tsurekawa, S ^a   Kido, K ^a   Watanabe, T ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BOUNDARY CONDITIONS; ELECTRONIC EQUIPMENT; GRAIN BOUNDARIES; MICROSCOPIC EXAMINATION;

KELVIN PROBE FORCE MICROSCOPY; LOW-ENERGY COINCIDENCE BOUNDARIES; POTENTIAL BARRIERS; RANDOM BOUNDARIES;

POLYSILICON;

EID: 27544508091     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/09500830500153859     Document Type: Article

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