Two-dimensional junction identification in multicrystalline silicon solar cells by scanning Kelvin probe force microscopy

Journal of Applied Physics

Volumn 104, Issue 10, 2008, Pages

  Jiang, C S ^a   Moutinho, H R ^a   Reedy, R ^a   Al Jassim, M M ^a   Blosse, A ^b  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b CaliSolar Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; PHOTOVOLTAIC CELLS; POLYSILICON; SCANNING; SEMICONDUCTOR JUNCTIONS; SILICON; SILICON SOLAR CELLS; SOLAR CELLS; SOLAR ENERGY; SOLAR EQUIPMENT; SURFACE TOPOGRAPHY;

DEVICE SIMULATIONS; ELECTRIC-FIELD; IDENTIFICATION PROCEDURES; JUNCTION DEPTHS; MULTICRYSTALLINE SILICON SOLAR CELLS; P-N JUNCTIONS; POTENTIAL MEASUREMENTS; SCANNING KELVIN PROBE FORCE MICROSCOPIES; SUBSEQUENT DATA ANALYSES;

TWO DIMENSIONAL;

EID: 57049104526     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3003131     Document Type: Article

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