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Volumn 74, Issue 10, 1999, Pages 1475-1477

Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution

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[No Author keywords available]

Indexed keywords


EID: 0001682548     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123585     Document Type: Article
Times cited : (75)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.