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Volumn 23, Issue 3, 2011, Pages 319-337

Molecular characterization of organic electronic films

Author keywords

ellipsometry; GIXD; morphology; NEXAFS; organic electronics; semiconducting polymers

Indexed keywords

ACTIVE LAYER; GENERAL METHODOLOGIES; GIXD; LAYERED STRUCTURES; LOW-COST ELECTRONICS; MOLECULAR CHARACTERIZATION; MOLECULAR PACKINGS; NEXAFS; ORGANIC ELECTRONIC MATERIALS; ORGANIC ELECTRONICS; ORGANIC FILMS; POLARIZED SPECTROSCOPY; REPEAT UNIT STRUCTURES; UNIT-CELL DIMENSIONS;

EID: 78650868260     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201001760     Document Type: Article
Times cited : (226)

References (102)
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    • J. L. Baker, S. Mannsfeld, L. H. Jimison, S. Volkman, S. Yin, V. Subramanian, A. Salleo, A. P. Alivisatos, M. F. Toney, unpublished
    • J. L. Baker, S. Mannsfeld, L. H. Jimison, S. Volkman, S. Yin, V. Subramanian, A. Salleo, A. P. Alivisatos, M. F. Toney, unpublished.
  • 83
    • 10644254613 scopus 로고    scopus 로고
    • Planaria Software LLC, Seattle, Washington.
    • ArgusLab 4.0.1, Mark A. Thompson, Planaria Software LLC, Seattle, Washington.
    • ArgusLab 4.0.1
    • Mark, A.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.